R23
ECE · 4-1
✓ VERIFIED VS. PUBLISHED SYLLABUS 2026-07-12
Design for Testability
JNTUK R23 · ECE · semester 4-1 · syllabus
This JNTUK R23 professional elective is listed for Electronics and Communication Engineering (ECE). It is listed in semester 4-1. It carries 3 credits. The published coverage runs across 5 units, from Unit I through Unit V.
Verified vs. published syllabus
Checked 12 Jul 2026
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Published evidence
✓ Verified
Checked 12 Jul 2026
Record 5 published units
Verification scope The course structure, credits, and unit-wise syllabus are sourced directly from JNTUK's official revised R23 ECE course structure and syllabus.
5 units, from Unit I to Unit V. Tick off units as you cover them — your progress stays on this device.
Unit-wise syllabus
0 / 5 COVERED
UNIT 01 — Unit I
Introduction to Testing: Testing Philosophy, Role of Testing, Digital and Analog VLSI Testing, VLSI Technology Trends affecting Testing, Types of Testing, Fault Modeling: Defects, Errors and Faults, Functional Versus Structural Testing, Levels of Fault Models, Single Stuck-at Fault.
UNIT 02 — Unit II
Logic and Fault Simulation: Simulation for Design Verification and Test Evaluation, Modeling Circuits for Simulation, Algorithms for True-value Simulation, Algorithms for Fault Simulation, ATPG.
UNIT 03 — Unit III
Testability Measures: SCOAP Controllability and Observability, High Level Testability Measures, Digital DFT and Scan Design: Ad-Hoc DFT Methods, Scan Design, Partial-Scan Design, Variations of Scan.
UNIT 04 — Unit IV
Built-In Self-Test: The Economic Case for BIST, Random Logic BIST: Definitions, BIST Process, Pattern Generation, Response Compaction, Built-In Logic Block Observers, Test-Per-Clock, Test- Per-Scan BIST Systems, Circular Self Test Path System, Memory BIST, Delay Fault BIST.
UNIT 05 — Unit V
Boundary Scan Standard: Motivation, System Configuration with Boundary Scan: TAP Controller and Port, Boundary Scan Test Instructions, Pin Constraints of the Standard, Boundary Scan Description Language: BDSL Description Components, Pin Descriptions.